Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII


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Harry Potter. Popular Features. New Releases. Description The main theme of the AMCTM conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields.


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    Flap copy The main theme of the AMCTM conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engineers working in the relevant fields. Learn about new offers and get more deals by joining our newsletter.

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    Sign up now. New dynamic calibration facilities have been developed, applying either periodic or shock excitations and using either primary or secondary calibration methods. The working principles of these calibration devices are described subsequently as well as the different approaches for the dynamic characterization of transducers, like step response, impulse response or harmonic response, respectively.

    Description

    From the scientific point of view, the harmonization of different dynamic calibration results is an essential requisite towards future standardization work. Despite the different technical realizations, the mathematical procedures and the problems for a dynamic characterization of transducers as well as the dissemination of the dynamic units are generally similar.

    These challenges are now approached by methods of a model-based calibration, which seem to give very promising results. High precision calibration of electromechanical transducers using dynamic loads is a field of rapidly growing demand in industries.

    Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII
    Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII
    Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII
    Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII
    Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII
    Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII
    Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII
    Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII
    Advanced Mathematical and Computational Tools in Metrology and Testing: Amctm VIII

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